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Beilstein J. Nanotechnol. 2019, 10, 2094–2102, doi:10.3762/bjnano.10.204
Figure 1: Schematic illustration of elastocapillary self-assembly of NWs induced by the surface tension betwe...
Figure 2: Representative AFM images of sample SiNW1 (a) and sample SiNW2 (b). The probed areas have a size of...
Figure 3: (a, b) Masks obtained by setting a threshold for the heights in the AFM images of SiNW1 and SiNW2 i...
Figure 4: (a, b) Schematic of the differential box counting method applied to the AFM measurements. Each AFM ...
Figure 5: Curves of the generalized dimension Dq as a function of q for different probed areas of samples SiN...
Figure 6: Multifractal spectra of sampled areas of MACE SiNW1 (a) and SiNW2 (b). The black line is the first ...